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Ma Shulang
Ma Shulang
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高側適用のための2段階酸化プロセスによるSTI nLDMOSのホットキャリア誘起劣化に及ぼす調査【Powered by NICT】
2016
Wei JiaXing
Zhang Chunwei
Liu Siyang
Sun Weifeng
Su Wei
Zhang Aijun
Ma Shulang
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