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Yamanaka Tadao
Yamanaka Tadao
Biasing
CMOS
Materials science
Electronic engineering
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Phase-Adjustable Error Detection Flip-Flops with 2-Stage Hold Driven Optimization and Slack Based Grouping Scheme for Dynamic Voltage Scaling
2008
Design Automation Conference
Kurimoto Masanori
Suzuki Hiroaki
Akiyama Rei
Yamanaka Tadao
Okuma Haruyuki
Takata Hidehiro
Shinohara Hirofumi
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Post-Silicon Programmed Body-Biasing Platform Suppressing Device Variability in 45 nm CMOS Technology
2008
International Symposium on Low Power Electronics and Design
Kashima Issei
Suzuki Hiroaki
Kurimoto Masanori
Yamanaka Tadao
Takata Hidehiro
Makino Hiroshi
Shinohara Hirofumi
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