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Aniruddha Konar

Samsung

3

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Surface roughness mediated specularity parameter of thin Cu films

2021 Applied Physics Letters
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Non-specular scattering of carriers from surface defects in thin metal interconnects

2020 Journal of Applied Physics
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Improved statistical variability and delay performance with junctionless inserted oxide FinFET

2020 Aeu-international Journal of Electronics and Communications
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