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Shuji Fujiwara

5

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Source engineering for ESD robust NLDMOS

2011 EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
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Anomalous ESD failures in NLDMOS during reverse recovery

2010 EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
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スギナ(Equisetum arvense L.)のグリホサートに対する感受性の系統間差と感受性検定法

2000 Journal of Weed Science and Technology
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The influence of SiN films on negative bias temperature instability and characteristics in MOSFET's

1998 ICMTS | International Conference on Microelectronic Test Structures
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