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M.J. Knitel
M.J. Knitel
Philips
Electronic engineering
CMOS
Gate oxide
Physics
Materials science
5
Papers
332
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RF-CMOS performance trends
2001
IEEE Transactions on Electron Devices
P.H. Woerlee
M.J. Knitel
R. van Langevelde
D.B.M. Klaassen
L.F. Tiemeijer
A.J. Scholten
A.T.A. Zegers-van Duijnhoven
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Citations (284)
Impact of process scaling on 1/f noise in advanced CMOS technologies
2000
IEDM | International Electron Devices Meeting
M.J. Knitel
P.H. Woerlee
A.J. Scholten
A.T.A. Zegers-van Duijnhoven
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Citations (30)
1