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Chris Pawlowicz

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The Role of Cloud Computing in a Modern Reverse Engineering Workflow at the 5nm Node and Beyond

2021
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Segmentation of Integrated Circuit Layouts from Scan Electron Microscopy Images

2018 CCECE | Canadian Conference on Electrical and Computer Engineering
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High-accuracy electron tomography of semiconductor devices

2015 Microscopy and Microanalysis
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Nondestructive in-line monitoring method for diffusion process control in InP

2003
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