Old Web
English
Sign In
Acemap
>
authorDetail
>
Y. Obeng
Y. Obeng
National Institute of Standards and Technology
Computer science
Semiconductor device
Metrology
Nanotechnology
Silicon
4
Papers
110
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post- CMOS Applications 11: 239th ECS Meeting
2021
H. Jagannathan
K. Kakushima
P. J. Timans
Evgeni Gusev
Z. Karim
Stefan De Gendt
Durga Misra
Y. Obeng
Freddy Roozeboom
Show All
Source
Cite
Save
Citations (0)
Preface : Silicon compatible emerging materials, processes, and technologies for advanced CMOS and post-CMOS applications 9
2019
Fred Roozeboom
P. J. Timans
K. Kakushima
E. P. Gusev
Z. Karim
Durga Misra
Y. Obeng
S. De Gendt
H. Jagannathan
Show All
Source
Cite
Save
Citations (0)
Publisher Correction: Metrology for the next generation of semiconductor devices
2018
Ndubuisi G. Orji
M. Badaroglu
Bryan M. Barnes
C Beitia
Benjamin Bunday
U. Celano
R J Kline
M. Neisser
Y. Obeng
András E. Vladár
Show All
Source
Cite
Save
Citations (0)
Metrology for the next generation of semiconductor devices
2018
Ndubuisi G. Orji
M. Badaroglu
Bryan M. Barnes
C Beitia
Benjamin Bunday
U. Celano
R J Kline
M. Neisser
Y. Obeng
András E. Vladár
Show All
Source
Cite
Save
Citations (110)
1