Old Web
English
Sign In
Acemap
>
authorDetail
>
M. Langenbuch
M. Langenbuch
STMicroelectronics
Oxide
Engineering
Electronic engineering
Capacitor
Boron
2
Papers
8
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Impact of interface and bulk trapped charges on transistor reliability
2005
Microelectronics Reliability
G. Ghidini
M. Langenbuch
Roberta Bottini
Daniela Brazzelli
Andrea Ghetti
Nadia Galbiati
G. Giusto
A. Garavaglia
Show All
Source
Cite
Save
Citations (3)
1