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hidetaka sawada
hidetaka sawada
Spherical aberration
Crystal
Analytical chemistry
Atom
Doping
5
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24aPS-37 Si結晶の高角度入射-STEM像の定量解析(24aPS 領域9ポスターセッション,領域9(表面・界面,結晶成長))
2010
syuu ken kin
yosifumi oosima
hidetaka sawada
naoto hasikawa
kyouiti rou asayama
kouzin kondou
masaki takeguti
keiko nakayama
yasusi makoto kokujou
kunio takayanagi
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25pWZ-3 Si結晶中Sbドーパント不活性クラスター構造(25pWZ X線・粒子線(電子線),領域10(誘電体格子欠陥,X線・粒子線フォノン))
2010
suhyon kin
yosifumi oosima
hidetaka sawada
naoto hasikawa
kyouiti rou asayama
kouzin kondou
yasusi makoto kokujou
kunio takayanagi
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26aYK-13 Detection of Arsenic Atoms doped in Silicon Crystalline using Spherical Aberration Corrected Scanning Transmission Electron Microscope
2009
Yoshifumi Oshima
Y. Hashimoto
hidetaka sawada
Naoto Hashikawa
Kyoichiro Asayama
Y. Kondo
Y. Tanishiro
K Takayanagi
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26aYK-13 収差補正走査型透過電子顕微鏡法によるシリコン結晶中ヒ素ドーパントの検出(X線・粒子線(電子線),領域10,誘電体,格子欠陥,X線・粒子線,フォノン物性)
2009
yosifumi oosima
yutaka hasimoto
hidetaka sawada
naoto hasikawa
kyouiti rou asayama
kouzin kondou
yasusi makoto kokujou
kunio takayanagi
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22pXB-8 球面収差補正 TEM によるシリコン界面の原子直視観察
2003
nobuo tanaka
jun yamazaki
hidetaka sawada
takesi tomita
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