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V. D. Pande
V. D. Pande
Surface roughness
Nanoscopic scale
Optics
Interferometry
Materials science
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Measurement of nanoscale surface roughness using electronic speckle pattern interferometer
2019
P. P. Padghan
V. D. Pande
P. U. Ingle
S S Sen
Aniket Gade
K. M. Alti
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