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Nishimura Kazuko
Nishimura Kazuko
Materials science
Optoelectronics
Image sensor
Shutter
Photoconductivity
7
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1
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Evaluation of Defects in Si Substrates Introduced by Stochastic Lateral Straggling during Plasma Exposure and Its Impact on Ultra-low Leakage Devices
2021
Yoshihiro Sato
Takayoshi Yamada
Nishimura Kazuko
Masayuki Yamasaki
Masashi Murakami
Keiichiro Urabe
Koji Eriguchi
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Evaluation of the effect of the 3D defect distribution created by plasma process on the dark current characteristics
2021
Yoshihiro Sato
Takayoshi Yamada
Nishimura Kazuko
Masayuki Yamasaki
Masashi Murakami
Keiichiro Urabe
Koji Eriguchi
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ブラジルと日本におけるCandida parapsilosisの内部転写スペーサー(ITS)領域およびrDNA配列5.8Sの遺伝的多様性
2005
Iida Soji
Imai Tamae
Oguri Toyoko
Okuzumi Katsuko
Yamanaka Ademar
Moretti-Branchini Maria Luiza
Nishimura Kazuko
Mikami Yuzuru
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Candida albicansの新規同定キット(RID Zyme CAS テスト)の評価
2005
Tanaka Reiko
Ito Junko
Sato Ayaka
Nishimura Kazuko
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A case of lung mucormycosis with erythroderma caused by Cunninghamella bertholletiae.
1997
Shishihara Takasuke
Kamei Katsuhiko
Edo Hideki
Kuriyama Takayuki
Nishimura Kazuko
Miyaji Makoto
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