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Toshiaki Yonezu
Toshiaki Yonezu
Renesas Electronics
Computer science
Redundancy (engineering)
Electronic engineering
Fuse (electrical)
Static random-access memory
3
Papers
23
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A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die
2008
IEEE Journal of Solid-state Circuits
Shigeki Ohbayashi
Makoto Yabuuchi
Kazushi Kono
Yuji Oda
Susumu Imaoka
Keiichi Usui
Toshiaki Yonezu
Takeshi Iwamoto
Koji Nii
Yasumasa Tsukamoto
Masashi Arakawa
Takahiro Uchida
Masakazu Okada
Atsushi Ishii
Tsutomu Yoshihara
Hiroshi Makino
Koichiro Ishibashi
Hirofumi Shinohara
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Citations (13)
A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die
2007
ISSCC | International Solid-State Circuits Conference
Shigeki Ohbayashi
Makoto Yabuuchi
Kazushi Kono
Yuji Oda
Susumu Imaoka
Keiichi Usui
Toshiaki Yonezu
Takeshi Iwamoto
Koji Nii
Yasumasa Tsukamoto
Masashi Arakawa
Takahiro Uchida
Masakazu Okada
Atsushi Ishii
Hiroshi Makino
Koichiro Ishibashi
Hirofumi Shinohara
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Citations (10)
招待講演 A 65nm embedded SRAM with wafer level burn-in mode, leak-bit redundancy and E-trim fuse for known good die (集積回路)
2007
International Solid-State Circuits Conference
Shigeki Ohbayashi
Makoto Yabuuchi
Kazushi Kono
Yuji Oda
Susumu Imaoka
Keiichi Usui
Toshiaki Yonezu
Takeshi Iwamoto
Koji Nii
Yasumasa Tsukamoto
Masashi Arakawa
Takahiro Uchida
Hiroshi Makino
Koichiro Ishibashi
Hirofumi Shinohara
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