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Phillip Sherman
Phillip Sherman
International Rectifier
Power MOSFET
Electronic engineering
Physics
Ion beam
Field-effect transistor
5
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75
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Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs
2011
IEEE Transactions on Nuclear Science
Jean-Marie Lauenstein
Neil Goldsman
Sandra Liu
J.L. Titus
Raymond L. Ladbury
Hak S. Kim
Anthony M. Phan
Kenneth A. LaBel
Max Zafrani
Phillip Sherman
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Citations (22)
Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs
2011
RADECS | European Conference on Radiation and Its Effects on Components and Systems
Sandra Liu
R. Marec
Phillip Sherman
J.L. Titus
Francoise Bezerra
Veronique Ferlet-Cavrois
Marc Marin
N. Sukhaseum
Fabien Widmer
Michele Muschitiello
Lionel Gouyet
R. Ecoffet
Max Zafrani
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Citations (4)
Probing the SEB Sensitive Depth of a Power MOSFET Using a Two-Photon Absorption Laser Method
2011
Jean-Marie Lauenstein
Sandra Liu
J.L. Titus
Dale McMorrow
Megan C. Casey
Stephen P. Buchner
Jeffrey H. Warner
Anthony M. Phan
Alyson D. Topper
Hak S. Kim
Kenneth A. LaBel
Becky Yang
Max Zafrani
Phillip Sherman
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Effects of Ion Species on SEB Failure Voltage of Power DMOSFET
2011
IEEE Transactions on Nuclear Science
Sandra Liu
Jean-Marie Lauenstein
Veronique Ferlet-Cavrois
R. Marec
Francisco Hernández
Leif Scheick
Francoise Bezerra
Michele Muschitiello
Christian Poivey
N. Sukhaseum
Lemuel Coquelet
Huy Cao
Douglass Carrier
Mark A. Brisebois
Renaud Mangeret
R. Ecoffet
Kenneth A. LaBel
Max Zafrani
Phillip Sherman
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Citations (28)
Worst-Case Test Conditions of SEGR for Power DMOSFETs
2010
IEEE Transactions on Nuclear Science
Sandra Liu
J.L. Titus
Max Zafrani
Huy Cao
Douglas Carrier
Phillip Sherman
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Citations (21)
1