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Alexandra Delvallee
Alexandra Delvallee
Optics
Nanotechnology
Physics
Nanoparticle
Dimensional metrology
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Methodology to evaluate the uncertainty associated with nanoparticle dimensional measurements by SEM
2019
Measurement Science and Technology
Loïc Crouzier
Alexandra Delvallee
Alexandre Allard
L. Devoille
Sébastien Ducourtieux
Nicolas Feltin
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Citations (10)
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