author-photo

N. Hofmann

Technische Universität Ilmenau

6

Papers

75

Citations

Citation Trend

Filter By

Papers (5) Sort By

Journal Conference Others

Nanomeasuring and nanopositioning engineering

2010 Measurement
Show All
- Source
- Cite
- Save
Citations (35)
Investigation of the metrological properties of a 3-D microprobe with optical detection system

2010 Proceedings of SPIE
Show All
- Source
- Cite
- Save
Citations (3)
Traceable Nanometrology Realized by Means of Nanopositioning and Nanomeasuring Machine

2008 Key Engineering Materials
Show All
- Source
- Cite
- Save
Citations (3)
Development of the interferometrical scanning probe microscope

2006 Proceedings of SPIE
Show All
- Source
- Cite
- Save
Citations (11)
Application of a positioning and measuring machine for metrological long-range scanning force microscopy

2005 Proceedings of SPIE
Show All
- Source
- Cite
- Save
Citations (15)