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R.R. Cizmarik
R.R. Cizmarik
Vanderbilt University
Physics
Electronic engineering
Stress (mechanics)
Passivation
Integrated circuit
4
Papers
57
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The impact of mechanical stress on the total-dose response of linear bipolar transistors with various passivation layers
2005
IEEE Transactions on Nuclear Science
R.R. Cizmarik
Ronald D. Schrimpf
Daniel M. Fleetwood
K.F. Galloway
Dale G. Platteter
M.R. Shaneyfelt
Ronald L. Pease
J. Boch
D. R. Ball
J.D. Rowe
Michael C. Maher
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Total dose effects in a linear Voltage regulator
2004
IEEE Transactions on Nuclear Science
P.C. Adell
Ronald D. Schrimpf
W. T. Holman
J.L. Todd
S. Caveriviere
R.R. Cizmarik
K.F. Galloway
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Citations (39)
Elevated temperature irradiation at high dose rate of commercial linear bipolar ICs
2003
RADECS | European Conference on Radiation and Its Effects on Components and Systems
J. Boch
F. Saigne
Ronald D. Schrimpf
Daniel M. Fleetwood
R.R. Cizmarik
D. Zander
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Citations (14)
Impact of mechanical stress on total-dose effects in bipolar ICs
2003
IEEE Transactions on Nuclear Science
J. Boch
Daniel M. Fleetwood
Ronald D. Schrimpf
R.R. Cizmarik
F. Saigne
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Citations (4)
1