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N. Ajika
N. Ajika
Electronic engineering
Engineering
Electrical engineering
Flash memory
Cycling
6
Papers
14
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A Highly Reliable Logic NVM "eCFlash (Embedded CMOS Flash)" Utilizing Differential Sense-Latch Cell with Charge-Trapping Storage
2008
International Memory Workshop
Taku Ogura
M. Mihara
Yoshiki Kawajiri
K. Kobayashi
S. Shimizu
S. Shukuri
N. Ajika
M Nakashima
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Citations (3)
Advantage of Floating Gate B4-Flash over Retention Reliability after Cycling - Characterization by Variation of Transconductance
2008
International Memory Workshop
S. Shukuri
N. Ajika
S. Shimizu
M. Mihara
Yoshiki Kawajiri
Taku Ogura
K. Kobayashi
M Nakashima
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Citations (5)
Floating Gate B4-Flash Memory Technology Utilizing Novel Programming Scheme - Highly Scalable, Efficient and Temperature Independent Programming -
2007
International Memory Workshop
S. Shukuri
N. Ajika
M. Mihara
Yoshiki Kawajiri
Taku Ogura
K. Kobayashi
S.T. Endoh
M Nakashima
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Citations (3)
A 1.8V 4Mb Floating-Gate NOR Type B4-Flash Test Chip for 100MB/s Programming Speed
2007
International Memory Workshop
M. Mihara
Yoshiki Kawajiri
K. Kobayashi
Taku Ogura
S. Shukuri
N. Ajika
M Nakashima
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Citations (3)
5V Operation Sector-er polar Transistor Selec e Flash Memory ITS) P-channel Cells
1998
Takahiro Ohnakado
N. Ajika
H. Hayashi
Hiroshi Takada
K. Kobayashi
Kazuyuki Sugahara
Shinichi Satoh
H. Miyoshi
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eliability of Native Oxi on Rapid Thermal Nit Free Capacitor Dielectrics ed Polysilicon
1990
N. Ajika
M Ohi
H. Arima
T. Matsukawa
N. Tsubouchi
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