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G. Whittemore
G. Whittemore
Axcelis Technologies
Analytical chemistry
High-κ dielectric
Electronic engineering
NMOS logic
Dielectric
3
Papers
3
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0
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Cost-Effective Low $V_{t}$ Ni-FUSI CMOS on SiON by Means of Al Implant (pMOS) and $\hbox{Yb}{+}\hbox{P}$ Coimplant (nMOS)
2008
IEEE Electron Device Letters
A. Lauwers
A. Veloso
S. Z. Chang
H. Yu
T. Hoffmann
C. Kerner
M. Demand
A. Rothschild
Masaaki Niwa
I. Satoru
R. Mitsuhashi
Mike Ameen
G. Whittemore
M. A. Pawlak
C. Vrancken
C. Demeurisse
S. Mertens
Wilfried Vandervorst
P. Absil
S. Biesemans
Jorge Kittl
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Achieving low V T Ni-FUSI CMOS via lanthanide incorporation in the gate stack
2007
ESSDERC | European Solid-State Device Research Conference
Anabela Veloso
Hong Yu Yu
Albert Lauwers
S. Z. Chang
Christoph Adelmann
Bart Onsia
M. Demand
S. Brus
C. Vrancken
R. Singanamalla
P. Lehnen
Jorge Kittl
T. Kauerauf
Rita Vos
Barry O'Sullivan
S. Van Elshocht
R. Mitsuhashi
G. Whittemore
K.M. Yin
M. Niwa
T. Hoffmann
Philippe Absil
Malgorzata Jurczak
S. Biesemans
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