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Katsuhiro Suma

Mitsubishi

8

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98

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Halbleiterspeichereinrichtung mit einer Redundanzzeile und einer Redundanzspalte, auf die vor einer Ersetzung zugegriffen werden kann

1996
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Features of SOI DRAM's and their Potential for Low-Voltage and/or Giga-Bit Scale DRAM's (Special Issue on ULSI Memory Technology)

1996 IEICE Transactions on Electronics
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Leakage mechanism due to floating body and countermeasure on dynamic retention mode of SOI-DRAM

1995 VLSIT | Symposium on VLSI Technology
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An SOI-DRAM with wide operating voltage range by CMOS/SIMOX technology

1994 ISSCC | International Solid-State Circuits Conference
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Highly reliable testing of ULSI memories with on-chip voltage-down converters

1993 IEEE Design & Test of Computers
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