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Giorgio Pollaccia
Giorgio Pollaccia
STMicroelectronics
Computer science
Burn-in
Electronic engineering
Reliability engineering
Automotive industry
8
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30
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Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures
2021
DDECS | Design and Diagnostics of Electronic Circuits and Systems
D. Appello
Paolo Bernardi
A. Calabrese
S. Littardi
Giorgio Pollaccia
S. Quer
V. Tancorre
R. Ugioli
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Citations (1)
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test
2019
DDECS | Design and Diagnostics of Electronic Circuits and Systems
F. Almeida
Paolo Bernardi
D. Calabrese
Marco Restifo
Matteo Sonza Reorda
D. Appello
Giorgio Pollaccia
V. Tancorre
R. Ugioli
G. Zoppi
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Citations (4)
An Optimized Test During Burn-In for Automotive SoC
2018
IEEE Design & Test of Computers
Davide Appello
Conrad Bugeja
Giorgio Pollaccia
Paolo Bernardi
Riccardo Cantoro
Marco Restifo
Ernesto Sanchez
Federico Venini
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Citations (3)
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC
2018
Journal of Electronic Testing
Davide Appello
Paolo Bernardi
Conrad Bugeja
Riccardo Cantoro
Giorgio Pollaccia
Marco Restifo
Federico Venini
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