author-photo

C. de Keukeleire

Alcatel-Lucent

5

Papers

3

Citations

Citation Trend

Filter By

Papers (3) Sort By

Journal Conference Others

Self-Heating Driven V th Shifts in Integrated VDMOS Transistors

2006 ISPSD | International Symposium on Power Semiconductor Devices and IC's
Show All
- Source
- Cite
- Save
Citations (2)
Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques

1996
Show All
- Source
- Cite
- Save
Citations (0)
Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques

1996
Show All
- Source
- Cite
- Save
Citations (0)