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Jennifer Spear
Jennifer Spear
Optics
Thin film
Analytical chemistry
Materials science
Optoelectronics
4
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10
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Pore Size Distribution Measurement of Porous Low-k Dielectrics Using TR-SAXS
2003
Shinichi Terada
Toru Kinashi
Jennifer Spear
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Citations (1)
Advances in X‐ray Reflectivity (XRR) and X‐ray Fluorescence (XRF) Measurements Provide Unique Advantages for Semiconductor Applications
2003
Jennifer Spear
Hiroyuki Murakami
Shinichi Terada
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Citations (4)
Determination of grain size distributions in magnetic recording media by grazing incidence X-ray diffraction
2001
IEEE Transactions on Magnetics
Shaoping Li
Charles Potter
Dean Palmer
Dennis D. Eberl
Tim Klemmer
Jennifer Spear
Celeste Reiss
Daniel Brown
Augusto Morrone
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Citations (3)
The effects of composition and doping on the response of GeC-Si photodiodes
1998
IEEE Journal of Selected Topics in Quantum Electronics
J. Kolodzey
Olivier Gauthier-Lafaye
S. Sauvage
Jean-Luc Perrossier
Philippe Boucaud
F. H. Julien
Jean-Michel Lourtioz
Fen Chen
B. A. Orner
Kristofer Roe
C. Guedj
R. G. Wilson
Jennifer Spear
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Citations (2)
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