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K. N. ManjulaRani
K. N. ManjulaRani
Cypress Semiconductor
Electronic engineering
Degradation (geology)
Computer science
Communication channel
Electrical engineering
4
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8
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Stress voltage dependence HCI induced traps distribution in 60V LDNMOS
2009
IIRW | International Integrated Reliability Workshop
Santanu Samanta
Nayan Patel
K. N. ManjulaRani
Kevin Jang
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Hot-carrier reliability study and simulation methodology development for 65nm technology
2009
IIRW | International Integrated Reliability Workshop
K. N. ManjulaRani
Ram Mohan Mooraka
Nayan Patel
Santanu Samanta
Geetha Narasimhan
N. Lakshminarayanan
Ravindra M. Kapre
Helmut Puchner
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A simulation methodology for the operational life time study of deep sub-micron technology integrated circuits using channel length dependent NBTI model
2007
PSD | International Workshop on Physics of Semiconductor Devices
Rammohan Mooraka
K. N. ManjulaRani
Dung Ho
Nitish Mathur
Helmut Puchner
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Simulating degradation of TDDB lifetime due to burn-in using pre-conditioning pulses
2007
PSD | International Workshop on Physics of Semiconductor Devices
K. N. ManjulaRani
Santanu Samanta
Nitish Mathur
Helmut Puchner
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Citations (3)
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