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Jason Parker

Texas Instruments

5

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Recovery of shifted MOS parameters induced by focused ion beam exposure

2002 IRPS | International Reliability Physics Symposium
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Correlation of logical failures to a suspect process step

1999 ITC | International Test Conference
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Expediting ramp-to-volume production

1999 ITC | International Test Conference
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IC test programming system for assigning logical function test data from the logic integrated circuit to a physical representation

1999
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