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M. Tucker
M. Tucker
Motorola
Electromigration
Microstructure
Materials science
Metallurgy
Void (astronomy)
1
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7
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The Effects of Test Condition, Microstructure and Linewidth on Electromigration Void Morphology
1995
MRS Proceedings
S.W. Bauguess
Michael L. Dreyer
M. Tucker
D. Theodore
C. T. Lee
S.R. Edwards
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Citations (7)
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