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Zixuan Sun
Zixuan Sun
Peking University
Chemistry
Electronic engineering
Optoelectronics
Degradation (geology)
Analytical chemistry
6
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20
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Body Bias Dependence of Bias Temperature Instability (BTI) in Bulk FinFET Technology
2021
Jiayang Zhang
Zirui Wang
Runsheng Wang
Zixuan Sun
Ru Huang
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Understanding Hot Carrier Degradation and Variation in FinFET Technology
2020
SSICT | International Conference on Solid-State and Integrated Circuits Technology
Runsheng Wang
Zhuoqing Yu
Jiayang Zhang
Zixuan Sun
Zhe Zhang
Ru Huang
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Citations (2)
Hot Carrier Degradation-Induced Dynamic Variability in FinFETs: Experiments and Modeling
2020
IEEE Transactions on Electron Devices
Zhuoqing Yu
Zixuan Sun
Runsheng Wang
Jiayang Zhang
Ru Huang
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Citations (7)
Prediction of Trap Occupancy for Random Telegraph Noise under Complex Waveforms
2020
IEEE Electron Device Letters
Zhe Zhang
Shaofeng Guo
Runsheng Wang
Jiayang Zhang
Zixuan Sun
Yangyuan Wang
Ru Huang
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A Novel Negative Capacitance Tunnel FET With Improved Subthreshold Swing and Nearly Non-Hysteresis Through Hybrid Modulation
2019
IEEE Electron Device Letters
Yang Zhao
Zhongxin Liang
Qianqian Huang
Cheng Chen
Mengxuan Yang
Zixuan Sun
Kunkun Zhu
Huimin Wang
Shuhan Liu
Tianyi Liu
Yue Peng
Genquan Han
Ru Huang
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Citations (5)
Investigation on the Lateral Trap Distributions in Nanoscale MOSFETs During Hot Carrier Stress
2019
IEEE Electron Device Letters
Zixuan Sun
Zhuoqing Yu
Zhe Zhang
Jiayang Zhang
Runsheng Wang
Peimin Lu
Ru Huang
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Citations (5)
1