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Changnam Park

Samsung

4

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28

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24.3 A Voltage and Temperature Tracking SRAM Assist Supporting 740mV Dual-Rail Offset for Low-Power and High-Performance Applications in 7nm EUV FinFET Technology

2019 ISSCC | International Solid-State Circuits Conference
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A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist circuitry for low-voltage applications

2018 ISSCC | International Solid-State Circuits Conference
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Half-and-Half Compare Content Addressable Memory with Charge-Sharing Based Selective Match-Line Precharge Scheme

2018 VLSIC | Symposium on VLSI Circuits
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12.2 A 7nm FinFET SRAM macro using EUV lithography for peripheral repair analysis

2017 ISSCC | International Solid-State Circuits Conference
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