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Y. Mamy Randriamihaja
Y. Mamy Randriamihaja
GlobalFoundries
Engineering
Electronic engineering
Voltage drop
Reliability engineering
High-temperature operating life
2
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3
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MTPM ramped programming optimization methodology
2017
IRPS | International Reliability Physics Symposium
Y. Mamy Randriamihaja
William McMahon
Andreas Kerber
Zakariae Chbili
B. Parameshwaran
Toshiaki Kirihata
Alberto Cestero
Norman Robson
Dan Moy
R. Katz
D. Anand
J. Pape
Subramanian S. Iyer
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Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing
2015
IRPS | International Reliability Physics Symposium
Y. Mamy Randriamihaja
William McMahon
Sriram Balasubramanian
Tanya Nigam
B. Parameshwaran
Randy W. Mann
Torsten Klick
T. Schaefer
A. Kumar
Yuncheng Song
Vivek Joshi
R. Ranjan
Fan Chen
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Citations (3)
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