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Aakihiko Ohsaki
Aakihiko Ohsaki
Dielectric
Delamination
Thermal
Chip
Electronic engineering
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J0103-1-3 Development of Evaluation Method for Delamination of Low-k Interlayer Dielectric Layer at Chip Corner during Thermal Cycle Test
2009
Yukihiro Kumagai
Hiroyuki Ohta
Masahiko Fujisawa
Takeshi Iwamoto
Aakihiko Ohsaki
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