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Eric C. Jones
Eric C. Jones
Analog Devices
Electronic engineering
Redundancy (engineering)
Bitmap
Parallel computing
Built-in self-test
2
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MBIST device for use with ECC-protected storage
2016
Andrew J. Allan
Eric C. Jones
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A 1GHz embedded DRAM macro and fully programmable BIST with at-speed bitmap capability
2005
MTDT | Memory Technology, Design and Testing
Valerie Lines
Robert Mckenzie
Hakjune Oh
Hong-Beom Pyeon
Matthew Dunn
Susan Palapar
Susan Coleman
Peter Nyasulu
Tony Mai
Seanna Pike
John McCready
Jody Defazio
Jin-Ki Kim
Robert A. Penchuk
Zvika Greenfield
Fredy Lange
Alberto Rodrigo Mandler
Eric C. Jones
Matthew Silverstein
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