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Kristina J. Trevino
Kristina J. Trevino
Colorado State University
Analytical chemistry
Chemistry
X-ray photoelectron spectroscopy
Contact angle
Plasma
5
Papers
75
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Isoelectric points of plasma‐modified and aged silicon oxynitride surfaces measured using contact angle titrations
2011
Surface and Interface Analysis
Kristina J. Trevino
Jeffrey C. Shearer
Patrick R. McCurdy
Shannon E. Pease-Dodson
Christabel C. Okegbe
Ellen R. Fisher
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Citations (9)
Comparing Isoelectric Point and Surface Composition of Plasma Modified Native and Deposited SiO2 Films Using Contact Angle Titrations and X‐ray Photoelectron Spectroscopy
2011
Plasma Processes and Polymers
Kristina J. Trevino
Jeffrey C. Shearer
Brendan D. Tompkins
Ellen R. Fisher
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Citations (14)
Plasma Diagnostics for Unraveling Process Chemistry
2008
Reviews in Analytical Chemistry
Joshua M. Stillahn
Kristina J. Trevino
Ellen R. Fisher
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Citations (33)
1