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Sim Jit-Shen
Sim Jit-Shen
Materials science
Electronic engineering
Residual
Wafer testing
Very-large-scale integration
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A Study of Center Field Stripe Yield Loss Mechanism
2006
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
A. Maurya
M.J. Bin Manaf
Z. Abdul Rahman
Sim Jit-Shen
Chong Seng Ong
Thung Beng Joo
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