Old Web
English
Sign In
Acemap
>
authorDetail
>
Raleigh Estrada
Raleigh Estrada
Carl Zeiss AG
Materials science
Microscopy
Electronic engineering
Metrology
Optics
5
Papers
13
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (5)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Advanced metrology and inspection solutions for a 3D world
2016
VLSIT | Symposium on VLSI Technology
Ingo Schulmeyer
Lorenz Lechner
Allen Gu
Raleigh Estrada
Diane K. Stewart
Lewis Stern
Shawn McVey
Bernhard Goetze
Ulrich Mantz
Raj Jammy
Show All
Source
Cite
Save
Citations (0)
Application of 3D X-ray microscopy for 3D IC process development
2016
Teng Wang
Ingrid de Wolf
Allen Gu
Raleigh Estrada
Show All
Source
Cite
Save
Citations (2)
Metrology and Inspection
2015
Gilles Fresquet
Jean-Philippe Piel
Sylvain Perrot
Hideo Takizawa
Osamu Sato
Allen Gu
Michael Feser
Bruce Johnson
Raleigh Estrada
Yoshitaka Tatsumoto
Show All
Source
Cite
Save
Citations (0)
3D X-Ray microscopy: A non destructive high resolution imaging technology that replaces physical cross-sectioning for 3DIC packaging
2013
ASMC | Advanced Semiconductor Manufacturing Conference
Yuri Sylvester
Bruce Johnson
Raleigh Estrada
Luke Hunter
Kevin P. Fahey
Tulip Chou
Y.L. Kuo
Show All
Source
Cite
Save
Citations (6)
3D X-ray microscopy: A near-SEM non-destructive imaging technology used in the development of 3D IC packaging
2013
DIC | IEEE International D Systems Integration Conference
Yuri Sylvester
Luke Hunter
Bruce Johnson
Raleigh Estrada
Show All
Source
Cite
Save
Citations (5)
1