Old Web
English
Sign In
Acemap
>
authorDetail
>
M. Polewski
M. Polewski
NXP Semiconductors
Engineering
Product certification
Root cause
Calibration
Bandwidth (signal processing)
2
Papers
3
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Pitfalls for CDM calibration procedures
2010
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Theo Smedes
M. Polewski
A. van IJzerloo
Jean Luc Lefebvre
M. Dekker
Show All
Source
Cite
Save
Citations (2)
1