Old Web
English
Sign In
Acemap
>
authorDetail
>
J.‐C. Lee
J.‐C. Lee
Fu Jen Catholic University
Dielectric
Ellipsometry
Nominal size
Gallium arsenide
Refraction
1
Papers
5
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Study of the optical properties of In0.52(AlxGa1−x)0.48As by variable angle spectroscopic ellipsometry
1995
Journal of Applied Physics
J.-W. Pan
Jia-Lin Shieh
J.-H. Gau
J.-I. Chyi
J.‐C. Lee
K.‐J. Ling
Show All
Source
Cite
Save
Citations (5)
1