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Ron S. Kao
Ron S. Kao
Charge density
Electronic engineering
Band gap
Gate oxide
Subthreshold conduction
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Analysis of MOSFET degradation due to hot-electron stress in terms of interface-state and fixed-charge generation
1988
Solid-state Electronics
Sunil Shabde
Anjan Bhattacharyya
Ron S. Kao
Richard S. Muller
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Citations (32)
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