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P. Shepeliavyi
P. Shepeliavyi
National Academy of Sciences
Analytical chemistry
Annealing (metallurgy)
Oxide
Silicon oxide
Volume fraction
4
Papers
8
Citations
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Characterization of oblique deposited nanostructured SiOx films by ellipsometric and IR spectroscopies
2010
Solid State Phenomena
A. Szekeres
E. Vlaikova
T. Lohner
Attila Tóth
I. Lisovskyy
S. Zlobin
P. Shepeliavyi
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Optical models for ellipsometric characterization of high temperature annealed nanostructured SiO2 films
2009
Journal of Optoelectronics and Advanced Materials
T. Lohner
A. Szekeres
T. Nikolova
E. Vlaikova
P. Petrik
G Huhn
K. Havancsak
I. Lisovskyy
S. Zlobin
I. Z. Indutnyy
P. Shepeliavyi
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Citations (3)
Effect of High-temperature Annealing on Evaporated Silicon Oxide Films: A Spectroscopic Ellipsometry Study
2009
A. Szekeres
E. Vlaikova
T. Lohner
P. Petrik
Á. Cziraki
S. Zlobin
P. Shepeliavyi
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Silicon clusters in silicon monoxide films
2005
Journal of Optoelectronics and Advanced Materials
A. Szekeres
T. Nikolova
A. Paneva
Á. Cziraki
Gy. Kovacs
I. Lisovskyy
D. Mazunov
I. Z. Indutnyy
P. Shepeliavyi
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Citations (5)
1