Old Web
English
Sign In
Acemap
>
authorDetail
>
Christopher E. Reid
Christopher E. Reid
Mentor Graphics
Engineering drawing
Multiple patterning
Electronic engineering
Engineering
Biasing
2
Papers
10
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
OPC and verification for LELE double patterning
2012
Kellen Arb
Christopher E. Reid
Qiao Li
Evgueni Levine
Pradiptya Ghosh
Show All
Source
Cite
Save
Citations (2)
Double patterning from design enablement to verification
2011
David Abercrombie
Pat LaCour
Omar El-Sewefy
Alex Volkov
Evgueni Levine
Kellen Arb
Christopher E. Reid
Qiao Li
Pradiptya Ghosh
Show All
Source
Cite
Save
Citations (8)
1