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Charles J. Camp
Charles J. Camp
IBM
Flash memory
Computer science
Flash file system
NAND gate
Bit error rate
5
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55
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MLC NANDフラッシュアレイにおける不完全ブロックに読出し擾乱の影響【Powered by NICT】
2016
N. Papandreou
Thomas Parnell
Thomas Mittelholzer
H. Pozidis
Thomas D. Griffin
Gary A. Tressler
Timothy J. Fisher
Charles J. Camp
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Effect of Read Disturb on Incomplete Blocks in MLC NAND Flash Arrays
2016
IMW | International Memory Workshop
Nikolaos Papandreou
Thomas Parnell
Thomas Mittelholzer
Haris Pozidis
Thomas D. Griffin
Gary A. Tressler
Timothy J. Fisher
Charles J. Camp
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Citations (8)
Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization
2015
ACM Transactions on Design Automation of Electronic Systems
Nikolaos Papandreou
Thomas Parnell
Haralampos Pozidis
Thomas Mittelholzer
Evangelos Eleftheriou
Charles J. Camp
Thomas D. Griffin
Gary A. Tressler
Andrew D. Walls
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Citations (11)
Disabling pages in a NAND flash memory system
2014
Charles J. Camp
Ioannis Koltsidas
Roman A. Pletka
Andrew D. Walls
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Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems
2014
GLSVLSI | Great Lakes Symposium on VLSI
Nikolaos Papandreou
Thomas Parnell
Haralampos Pozidis
Thomas Mittelholzer
Evangelos Eleftheriou
Charles J. Camp
Thomas D. Griffin
Gary A. Tressler
Andrew D. Walls
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Citations (36)
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