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Vicky Svidenko

Applied Materials

8

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8

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Protocol to identify a topological superconducting phase in a three-terminal device.

2021 arXiv: Mesoscale and Nanoscale Physics
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Yield Optimization in Photovoltaic Manufacturing

2010 PEC | World Conference on Photovoltaic Energy Conversion
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Accurate Litho Model Tuning Using Design-Based Defect Binning

2008 IEEE Transactions on Semiconductor Manufacturing
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Dynamic defect-limited yield prediction by criticality factor

2007 ISSM | International Symposium on Semiconductor Manufacturing
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Identification of Process Window Limiting Structures by Design-Based Defect Binning

2007 ASMC | Advanced Semiconductor Manufacturing Conference
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Advanced SEM-based metrology of systematic defects

2005 ISSM | International Symposium on Semiconductor Manufacturing
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