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W. Y. Teng

United Microelectronics Corporation

CMOS
Electronic engineering
MOSFET
Silicon carbide
Engineering

2

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1

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A new and simple experimental approach to characterizing the carrier transport and reliability of strained CMOS devices in the quasi-ballistic regime

2009 IEDM | International Electron Devices Meeting
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Design of high-performance and highly reliable nMOSFETs with embedded Si:C S/D extension stressor(Si:C S/D-E)

2006 VLSIT | Symposium on VLSI Technology
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