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Jung-Jin Shim
Jung-Jin Shim
Materials science
Composite material
Ion implantation
Annealing (metallurgy)
Surface roughness
2
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1
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0
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Temperature and Time Dependent Thermal Splitting in Plasma Activated Bonded Wafers
2007
Jung-Jin Shim
Sang-Hyun Lee
Hyung-Sang Yuk
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Strain Degradation in Strained-Si Layers Far Thicker than the Critical Thickness Grown on Relaxed Si0.65Ge0.35 Layers
2006
Suk June Kang
Hyung-Sang Yuk
In-Kyum Kim
Jea-Chun Lee
Sang-Hyun Lee
Jung-Jin Shim
Bo-Young Lee
James Fiorenza
M. Curtin
Anthony Lochtefeld
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