author-photo

Cheng-li Lin

United Microelectronics Corporation

5

Papers

6

Citations

Citation Trend

Filter By

Papers (5) Sort By

Journal Conference Others

Stress Analysis in GaN Epilayer after Chemical Mechanical Polishing (CMP) from Sapphire Substrates

2009 The Japan Society of Applied Physics
Show All
- Source
- Cite
- Save
Citations (0)
Ultra-thin Gate Oxide Lifetime Projection and Degradation Mechanism beyond 90 nm CMOS Technology

2006 IIRW | International Integrated Reliability Workshop
Show All
- Source
- Cite
- Save
Citations (1)
Comprehensive Solution for Ultrathin Oxide Reliability Projections Including Novel Explanation for Power-Law Exponent Variations

2006 Japanese Journal of Applied Physics
Show All
- Source
- Cite
- Save
Citations (1)
The Correlation of Interface Defect Density and Power-Law Exponent Factor on Ultra-thin Gate Dielectric Reliability

2006 IIRW | International Integrated Reliability Workshop
Show All
- Source
- Cite
- Save
Citations (3)
Ultra-thin Oxide Lifetime Projection and Comparison of nFET and pFET for 90nm/65nm Application

2006 The Japan Society of Applied Physics
Show All
- Source
- Cite
- Save
Citations (1)