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Hee-Hwan Ji
Hee-Hwan Ji
Electronic engineering
Engineering
CMOS
Semiconductor device
Sheet resistance
2
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2
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Thermally Robust Nickel Silicide Process for Nano-Scale CMOS Technology
2005
IEICE Transactions on Electronics
Soon-Young Oh
Jang-Gn Yun
Bin-Feng Huang
Yong-Jin Kim
Hee-Hwan Ji
Sang-Bum Huh
Han-Seob Cha
Ui Sik Kim
Jin-Suk Wang
Hi-Deok Lee
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