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Shuuichi Asahina
Shuuichi Asahina
Rutherford backscattering spectrometry
Thallium
X-ray crystallography
Lattice constant
Molecular beam epitaxy
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X-Ray Diffraction Measurements on Lattice Mismatch of InTlAs Grown on InAs Substrates
2001
Japanese Journal of Applied Physics
Yasutomo Kajikawa
Shuuichi Asahina
Nobuyuki Kanayama
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