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J. Romero
J. Romero
Advanced Micro Devices
Metallurgy
Electromigration
Materials science
Surface finish
Copper interconnect
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Characterization of the Cu/barrier metal interface for copper interconnects
1998
IITC | International Interconnect Technology Conference
Takeshi Nogami
J. Romero
V. Dubin
D. Brown
E. Adem
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