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L.K. Hai
L.K. Hai
Electronic engineering
MOSFET
Transistor
Engineering
Ultra-high vacuum
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Effect of Energy Contamination on the P-Channel Transistor Characteristics
2004
ICSE | IEEE International Conference on Semiconductor Electronics
T. Thanigaivelan
K. Ibrahim
L.K. Hai
N. Shahri
M. Huzainy
A Sani
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