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B. Feil
B. Feil
Freescale Semiconductor
Magnetoresistive random-access memory
Electronic engineering
Tunnel magnetoresistance
Physics
CMOS
2
Papers
24
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High speed toggle MRAM with mgO-based tunnel junctions
2005
IEDM | International Electron Devices Meeting
Jon M. Slaughter
Renu W. Dave
Mark A. Durlam
G. Kerszykowski
K. Smith
K. Nagel
B. Feil
J. Calder
M. DeHerrera
Bradley J. Garni
S. Tehrani
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Citations (24)
Electromigration of MRAM-customized Cu interconnects with cladding barriers and top cap
2004
IIRW | International Integrated Reliability Workshop
D.A. Gajewski
T. Meixner
B. Feil
M. Lien
James Walls
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