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L. Vela Reyes
L. Vela Reyes
Benemérita Universidad Autónoma de Puebla
Distortion
Focal length
Thin lens
Refractive index
Z-scan technique
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Automated Z‐Scan to Distinguish Different Types of Nonlinearity Without Proposing it
2008
E. Reynoso Lara
M.D. Iturbe-Castillo
C. G. Treviño Palacios
J. A. Dávla Pintle
L. Vela Reyes
E. A. Martí Panameño
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