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Nikola D. Vasović

University of Niš

11

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144

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Razlika između odziva RADFET u statičkom i dinamičkom on-line mernom sistemu prilikom izlaganja gama zračenju Co60

2017
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Automatic and reliable electrical characterization of MOSFETs

2014 DDECS | Design and Diagnostics of Electronic Circuits and Systems
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Radiochemistry on chip

2013 Lab on a Chip
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A switching system based on microcontroller for successive applying of MGT and CPT on MOSFETs

2012 Measurement
- Nikola D. Vasović
- Goran S. Ristić
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The fixed oxide trap modelling during isothermal and isochronal annealing of irradiated RADFETs

2012 Journal of Physics D
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The sensitivity of 100 nm RADFETs with zero gate bias up to dose of 230 Gy(Si)

2011 Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
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Interface and oxide state behaviors of commercial n-channel power MOSFETs during high electric field stress and thermal annealing at 150 °C

2011 Semiconductor Science and Technology
- Goran S. Ristić
- Nikola D. Vasović
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